Electron Microscopy Unit Yong Loo Lin School of Medicine, National University of Singapore MD1, Tahir Foundation Building, #B1-01 12 Science Drive 2 Singapore 117549
What it is:
A scanning electron microscope (SEM) that allows observation of surface information of conductive and non-conductive samples with SE and BSE imaging possible in every mode of operation.
Manufacturer: FEI Company (Thermofisher Scientific)
Model Name: Quanta 650 FEG
Instrument Overview: The Quanta 650 features a large sample chamber that enables imaging of samples of all sizes. It can be used to collect topographic information (SE mode) and observe elemental contrast (BSE mode) in the sample. Surface imaging with optional beam deceleration mode is possible to obtain surface and compositional information from conductive samples. Easy to use and intuitive controls make highly effective operation possible for novice users.
The MAPS software does automatic acquisition of large overviews at any magnification, allowing high resolution imaging of large areas.
Technical features and specifications:
Emitter: Schottky Field Emission
Accelerating voltage: 1 to 30kV
High vacuum and low vacuum conditions
SE and BSE imaging modes
Beam deceleration mode
MAPS software
