Electron Microscopy Unit Yong Loo Lin School of Medicine, National University of Singapore MD1, Tahir Foundation Building, #B1-01 12 Science Drive 2 Singapore 117549
EM: JEOL JSM-6701F FEG SEM What it is:
A scanning electron microscope (SEM) that allows observation of surface information of conductive and non-conductive samples with SE and BSE imaging.
Manufacturer: JEOL Ltd
Model Name: JSM-6701F
Instrument Overview: The JSM-6701F is suitable for observation of fine structures such as multi-layered film and nano particles fabricated by the nano technology. The high-resolution semi in-lens enables one to observe delicate specimens with minimum damage at very low accelerating voltages. At lower voltages, the fine surface structures can be observed more clearly than at higher voltages. It can be used to collect topographic information (SE and LEI mode) and observe elemental contrast (BSE mode) in the sample.
Technical features and specifications:
Emitter: Cold cathode Field Emission
Accelerating voltage: 0.5 to 30kV
High vacuum condition
SE, LEI and BSE imaging modes
