EMF (NUS)

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The Electron Microscopy Facility (EMF) at NUS is a university-level research facility focused on the science and application of electron and ion-beam microscopy. At EMF, we serve all institutional departments by providing state-of-the-art instrumentation and the expertise required for high-resolution imaging — down to the atomic-level — of a wide variety of materials.

 

Key Capabilities

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S/TEM
- TEM, HR-TEM, WBDF, SAED, CBED, NBED
-STEM, 4D-STEM, EDS, EELS, Cryo-TEM, in-situ heating/biasing, gas-cell
...
Focused Ion Beam
Ga+, Ne+, He+ ion beams
C, Pt deposition
Micromanipulator
Nanoscale milling / patterning
...
Scanning Electron Microscopy
SE, BSE imaging, EDS
...
Auxiliary
Mechanical preparation tools
Ion-beam preparation tools
Coater/cleaner
Light microscopes
Specialised holders

Our comprehensive suite of instrumentation includes a 5th order aberration-corrected scanning transmission electron microscope (STEM) equipped with Energy-Dispersive X-ray Spectrometer (EDS), Electron Energy Loss Spectrometer (EELS), 4D-STEM detector, and a variety of in-situ sample holders (cryo transfer, biasing & heating, gas cell), as well as He-ion, Ne-ion, and Ga-ion focused ion beams for patterning and sample preparation.

Our operations cover

STAFF PERSONNEL/TEAM

Contact Information

Address

EMF @NUS

College of Design and Engineering

E7 Building Level 1

Singapore 119276

Contact point

Samuel Lim Jia Jun

Digital Communications

samuel@nus.edu.sg

TECHNOLOGY PLATFORM