FACTS (NTU)

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FACTS is Nanyang Technological University’s shared facility specialising in characterisation in the field of electron microscopy and X-ray techniques for chemical, structural and morphological analysis. We provide instrument usage, consultation, training and education for our users.

The facility is located at a centralised, purpose-built site for the best instrumentation performance to help users to achieve the best possible results. The facility is open to all students, scientists and engineers at NTU who are conducting cutting edge research. It is also open to researchers elsewhere in Singapore and abroad. FACTS caters for both expert and casual users. The latter can call upon our research scientists for expert advice and operation of these instruments.

 

Key Capabilities

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SEM and TEM
Imaging and diffraction at the macroscopic, microscopic and atomic levels via the aberration-corrected TEM (ACTEM).
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X-RAY ENERGY DISPERSIVE SPECTROSCOPY & WAVELENGTH DISPERSIVE SPECTROSCOPY
Elemental analysis, for general and regional mapping of samples for qualitative and quantitative analysis.

Modern large area EDS detectors in the facility facilitate low dose and low acceleration voltages for high resolution and in-situ work.

Electron energy-loss spectroscopy (EELS) and energy-filtered TEM provide similar complementary compositional analysis within the TEMs.
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XRD
Electron backscattered diffraction on the SEM and a high-resolution X-ray diffractometer (XRD) for establishing sample crystallographic texture, orientation mapping, grain distribution analysis, pole figures and residual stress measurements, etc.

Precession electron diffraction and 4D-STEM detectors are available for crystallographic survey on the Aberration-corrected TEM.
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XPS and AES
Surface analysis tools such as X-ray photoelectron spectroscopy (XPS) and Auger electron spectroscopy (AES) provide chemical and bonding states of materials at the material surface.

Depth profiling of devices via gas-cluster ion milling is possible; likewise for ultraviolet photoelectron spectroscopy and low energy reflective electron loss spectroscopy.
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SAMPLE PREPARATION
Focused Ion Beam (FIB) and a broad beam argon-ion cross section and polishing system are available for the preparation of samples at specified regions of interest.

The FIB is capable of TEM lamella preparation and sample patterning, and can also do concurrent pre-screening work with its attached EDS.

NTU FACTS is supported by a highly experienced team of scientists to ensure the best selection of techniques and interpretation of results. This is complemented by the facility links to subject matter experts from within the university and our partners from other local, overseas research institutes and industries. In this aspect, we focus on knowledge sharing, exploration of interdisciplinary characterisation work; new techniques, such as in-situ experimental work in electron microscopy and X-ray work. As such FACTS organises regular short courses, seminars and workshops to cover the range from introductory to advanced topics in areas of characterisation for users to explore the techniques available.

Our operations cover

full assistance in sample processing
training
user support
consulting on sample preparation

STAFF PERSONNEL/TEAM

Contact Information

Address

FACTS@ABN:

61 Nanyang Drive
Academic Building North
Basement 4
Unit # ABN-B4b-10
Singapore 637335

 

FACTS@N4.1:

50 Nanyang Avenue, 
North Spine,
Block N4.1-B4-10,
Singapore 639798

Contact point

Tel: 67906158 or 65921813

Email: facts@ntu.edu.sg (for NTU users)

Email: facts-external@ntu.edu.sg (for non NTU enquiries)

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