EMF @NUS College of Design and Engineering E7 Building Level 1 Singapore 119276
What it is: The JEM-ARM200F is a 200kV cold field-emission, probe-corrected transmission electron microscope with a STEM resolution of 0.078 nm and TEM resolution of 0.1 nm.
Manufacturer: JEOL Ltd.
Model Name: JEM-ARM200F
Applications: STEM, TEM, EELS, EDS
Instrument Overview: The JEM-ARM200F is a 200kV cold field-emission, probe-corrected transmission electron microscope with a STEM resolution of 0.078 nm and TEM resolution of 0.1 nm. It also has an energy-dispersive X-ray detector and dual energy loss spectrometers that can form elemental maps at atomic resolution, and a fast CMOS camera. With its probe aberration corrector and ultra-high-resolution pole-piece it is particularly suited to STEM imaging and analysis.
Charges: User operated (NUS) – $150/hour for office hours, $100/hour outside office hours; Staff-assisted User (NUS) – $300/hour; Staff-assisted User (External) – $600/hour
Instrument Manufacturer URL: https://www.jeol.com/
Detailed Specifications: https://www.jeol.com/products/scientific/tem/JEM-ARM200F_ACCELARM.php
