JEOL JEM-3010

  EMF @NUS College of Design and Engineering E7 Building Level 1 Singapore 119276

What it is: The JEOL JEM-3010 is a 300kV transmission electron microscope with a LaB6 electron source.

Manufacturer: JEOL Ltd.

Model Name: JEM-3010

Applications: TEM

Instrument Overview: The JEM-3010 Electron Microscope, a 300KV ultrahigh resolution analytical TEM (transmission electron microscope), has been born out of the ultrahigh resolution, micro-area analysis, electron diffraction, and convergent beam electron diffraction techniques. This UHR (ultrahigh resolution) type JEM-3010 provides a theoretical resolution of 0.17nm and a microprobe diameter of 1.0nm in diameter allowing the ultra-micro-area X-ray analysis, ultramicroarea electron diffraction, and convergent beam electron diffraction to be carried out while directly observing structure images which show atomic arrays.

Charges: User operated (NUS MSE) – $100/hour; User operated (NUS) – $160/hour; Staff-assisted User (NUS) – $250/hour; Staff-assisted User (External) – $450/hour

Instrument Manufacturer URL: https://www.jeol.com/

Key Contacts

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