EMF @NUS College of Design and Engineering E7 Building Level 1 Singapore 119276
What it is: The FEI Helios 450S FIB is a dual beam Ga+ ion & electron microscope with high-resolution topographical imaging and patterning capabilities.
Manufacturer: Thermo Fisher Scientific
Model Name: FEI Helios 450S
Applications: FIB, SEM
Instrument Overview: The FEI Helios 450S FIB is a dual beam Ga+ ion & electron microscope with high-resolution topographical imaging and patterning capabilities. The electron beam is primarily used for surface characterization, while the ion beam is used for top-down fabrication tasks such as TEM lamella preparation, cross-section failure analysis, and nanoscale surface modification. The stability of the low voltage ion beam and chamber cleaning attachments reduces contamination and amorphization vital for S/TEM analysis.
Charges: User operated (NUS) – $100/hour; Staff-assisted User (NUS) – $280/hour; Staff-assisted User (External) – $450/hour
