Hitachi FlexSEM 1000 II
What is it? A compact scanning electron microscope (SEM) can be used for standard SEM imaging (visualising surface topography) of biological or material sciences samples.
Manufacturer: Hitachi
Model Name: FlexSEM 1000 II
Applications SEM surface topography imaging
Instrument Overview: This compact scanning electron microscope (SEM) can be used for standard SEM imaging (visualising surface topography) of biological or material sciences samples suitable for SEM observation. It features detectors for secondary electrons and for backscattered electrons as well as an ultra-variable-pressure detector for imaging non-conductive samples at low vacuum. A colour camera inside the sample chamber facilitates selecting the imaged area. Under optimal conditions the microscope can achieve image resolution as good as 4 nm.
Technical features and specifications:
Magnification: 6 – 300,000x
Electron sources: Tungsten filament
Detectors: Everhart Thornley secondary electron detector, High-sensitivity semiconductor detector for backscattered electrons, Ultra-variable-pressure detector (UVD)
Stage: Motorised
Software: FlexSEM 1000
Charges:
User operated: $30/hour, Staff operated: $96/hour
Instrument Manufacturer URL:
https://www.hitachi-hightech.com/global/product_detail/?pn=em-flexsem1000
Detailed Specifications:
https://www.nobic.sg/ABIF/Hitachi_FlexSEM_1000.html
