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A reliable and versatile Transmission Electron Microscope (TEM) for daily materials analysis.
Manufacturer: ThermoFisher Scientific
Model Name: Talos F200X G2
Instrument overview:
The Talos TEM operates with accelerating voltages at 80 or 200 kV, providing fast, precise and quantitative analysis of materials. Equipped with a high-brightness electron source and a Super-X EDX detector, it can analyze low-concentration and light elements. The low-dose beam mode reduces sample damage, making it possible for imaging delicate materials and achieving high-contrast images of organic materials. Additionally, the segmented STEM detectors offer imaging modes like differential phase contrast (DPC) and integrated differential phase contrast (iDPC). Furthermore, the Talos TEM provides three-dimensional electron tomography and MicroED for structural determination of MOF and COF crystals.
Technical features and specifications:
Electron source: Schottky X-FEG electron source operated at accelerating voltages of 80 or 200 kV
Resolution: 0.12nm (TEM); 0.16nm (STEM-HAADF)
Spectroscopy: Super-X, four silicon drift detectors (SDD) with solid angle of 0.9 srad (EDX)
Camera: 4k x 4k Ceta camera
STEM Detectors: High-angle annular dark field (HAADF), segmented detection system (bright-field, dark field, DPC and iDPC)
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