JEOL JSM-6360LV Scanning Electron microscope (#02-24)

  1 Research Link National University of Singapore Singapore 117604

What it is: Scanning electron microscope.

Manufacturer: JEOL

Model Name: JEOL JSM-6360LV

Applications: Scanning electron microscopy

Instrument Overview: Scanning electron microscope with low vacuum mode capabilities.

 

Technical features and specifications:

Imagers:

  • Everhart Thornley secondary electron Detector
  • Backscatter Electron Detector

 

Software: JEOL SEM Imaging Software

 

Charges:

Please contact bioimaging@tll.org.sg for latest updated charges

 

Instrument Manufacturer URL:

(not available)

 

Detailed Specifications:

http://microscopy.tll.org.sg/pages/elec_micro%20-%20SEM.html

Key Contacts

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